We really enjoyed being a part of SPIE Photonics West this year. The show continues to grow every year and is a great venue for us to meet researchers who bring us their metrology challenges. Apart from our multi-mode metrology solutions, we highlighted our new multi-surface software for microfluidic devices, our enhanced film thickness measurement capability and our recent advances in wafer level chip scale packaging (WLCSP / FOWLP) applications.
Visitors received a demonstration of the Zeta-20 Optical Profiler and saw its ability to image samples without any sample preparation in the middle of a busy show floor. The same non-contact and vibration insensitive optical engine is used to power all of our tools and provides reliable and repeatable process control data in some of the busiest fabs around the world. Zeta's groundbreaking multi-mode optical profilers are the leading metrology choice for research institutions and industries such as solar cell, HBLED, microfluidics and semiconductor.