The Zeta Shearing Interferometer (ZSI) further enhances ZIC technique by incorporating a proprietary phase adjustment mechanism and advanced data processing software. The result is a non-contact optical profiler with Angstrom level Z sensitivity.
The ZSI technique does not require expensive interferometric objectives or special vibration isolation tables. In addition, no Z scanning is necessary. All these translate to better XY resolution, higher level of user friendliness, faster and more reliable data acquisition, and less facility and maintenance related costs.
|Typical Optical Parameters|
|Objective Mag||5X to 100X|
|Field of View||90 μm to 4.5 mm|
|Z Sensivity||< 0.5 Å|
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IMMEDIATE PRODUCT INFORMATION
Thermal Asperity Defect on Magnetic Disk Media
2.39 nm high asperity.
MicroPit Defect on Magnetic Disk Media
23.76 nm deep micro pit.